ADC (r_adc)

Functions
fsp_err_t	R_ADC_Open (adc_ctrl_t *p_ctrl, adc_cfg_t const *const p_cfg)
fsp_err_t	R_ADC_ScanCfg (adc_ctrl_t *p_ctrl, void const *const p_channel_cfg)
fsp_err_t	R_ADC_CallbackSet (adc_ctrl_t *const p_ctrl, void(*p_callback)(adc_callback_args_t *), void *const p_context, adc_callback_args_t *const p_callback_memory)
fsp_err_t	R_ADC_ScanStart (adc_ctrl_t *p_ctrl)
fsp_err_t	R_ADC_ScanGroupStart (adc_ctrl_t *p_ctrl, adc_group_mask_t group_mask)
fsp_err_t	R_ADC_ScanStop (adc_ctrl_t *p_ctrl)
fsp_err_t	R_ADC_StatusGet (adc_ctrl_t *p_ctrl, adc_status_t *p_status)
fsp_err_t	R_ADC_Read (adc_ctrl_t *p_ctrl, adc_channel_t const reg_id, uint16_t *const p_data)
fsp_err_t	R_ADC_Read32 (adc_ctrl_t *p_ctrl, adc_channel_t const reg_id, uint32_t *const p_data)
fsp_err_t	R_ADC_SampleStateCountSet (adc_ctrl_t *p_ctrl, adc_sample_state_t *p_sample)
fsp_err_t	R_ADC_InfoGet (adc_ctrl_t *p_ctrl, adc_info_t *p_adc_info)
fsp_err_t	R_ADC_Close (adc_ctrl_t *p_ctrl)
fsp_err_t	R_ADC_Calibrate (adc_ctrl_t *const p_ctrl, void const *p_extend)
fsp_err_t	R_ADC_OffsetSet (adc_ctrl_t *const p_ctrl, adc_channel_t const reg_id, int32_t offset)

Detailed Description

Driver for the and ADC12 peripherals on RZ microprocessor. This module implements the ADC Interface.

Overview

Features

The ADC module supports the following features:

• 12 bit maximum resolution depending on the MPU
• Configure scans to include:
  • Multiple analog channels
• Configurable scan start trigger:
  • Software scan triggers
  • Hardware scan triggers (timer expiration, for example)
  • External scan triggers from the ADTRGn port pins
• Configurable scan mode:
  • Single scan mode, where each trigger starts a single scan
  • Continuous scan mode, where all channels are scanned continuously
  • Group scan mode, where channels are grouped into group A and group B and group C. The groups can be assigned different start triggers, and group A can be given priority over group B. When group A has priority over group B, a group A trigger suspends an ongoing group B scan.
• Supports adding and averaging converted samples
• Optional callback when scan completes
• Sample and hold support
• Double-trigger support
• Hardware comparator with interrupt and event output

Configuration

Build Time Configurations for r_adc

The following build time configurations are defined in fsp_cfg/r_adc_cfg.h:

Configuration	Options	Default	Description
Parameter Checking	Default (BSP) Enabled Disabled	Default (BSP)	If selected code for parameter checking is included in the build.
Multiplex Interrupt	Enabled Disabled	Disabled	Enable multiplex interrupt system-wide.

Configurations for Analog > ADC (r_adc)

This module can be added to the Stacks tab via New Stack > Analog > ADC (r_adc).

Configuration	Options	Default	Description
General > Name	Name must be a valid C symbol	g_adc0	Module name
General > Unit	Unit must be a non-negative integer	0	Specifies the ADC Unit to be used.
General > Clear after read	Off On	On	Specifies if the result register will be automatically cleared after the conversion result is read.
General > Mode	Single Scan Continuous Scan Group Scan	Single Scan	Specifies the mode that this ADC unit is used in.
General > Double-trigger	Disabled Enabled Enabled (extended mode)	Disabled	When enabled, the scan-end interrupt for Group A is only thrown on every second scan. Extended double-trigger mode (single-scan only) triggers on both ELC events, allowing (for example) a scan on two different timer compare match values. In group mode Group B is unaffected.
Input > Sample and Hold > Sample and Hold Channels (Available only on selected MPUs)	Channel 0 Channel 1 Channel 2		Specifies if this channel is included in the Sample and Hold Mask.
Input > Sample and Hold > Sample Hold States (Applies only to channels 0, 1, 2)	Must be a valid non-negative integer with configurable value 4 to 255	24	Specifies the updated sample-and-hold count for the channel dedicated sample-and-hold circuit
Input > Window Compare > Window A > Enable	MCU Specific Options		Enable or disable comparison with Window A.
Input > Window Compare > Window A > Channels to compare (channel availability varies by MPU and unit)	Refer to the RZN Configuration tool for available options.		Select channels to be compared to Window A.
Input > Window Compare > Window A > Channel comparison mode (channel availability varies by MPU and unit)	Refer to the RZN Configuration tool for available options.		Checking a box sets the comparison mode for that channel to Greater Than or Inside Window depending on whether Window Mode is disabled or enabled (respectively). If left unchecked the comparison mode will likewise be Less Than or Outside Window (respectively).
Input > Window Compare > Window A > Lower Reference	Must be a positive 16-bit integer.	0	Set the lower comparison value.
Input > Window Compare > Window A > Upper Reference	Must be a positive 16-bit integer.	0	Set the upper comparison value.
Input > Window Compare > Window B > Enable	MCU Specific Options		Enable or disable comparison with Window B.
Input > Window Compare > Window B > Channel to compare (channel availability varies by MPU and unit)	MCU Specific Options		Select a channel to be compared to Window B.
Input > Window Compare > Window B > Comparison mode	Less Than or Outside Window Greater Than or Inside Window	module.driver.rzn.adc.compare.window_b.mode	Select the comparison mode for Window B. For each option, the first condition applies when Window Mode is disabled and the second option applies when Window Mode is enabled.
Input > Window Compare > Window B > Lower Reference	Must be a positive 16-bit integer.	0	Set the lower comparison value.
Input > Window Compare > Window B > Upper Reference	Must be a positive 16-bit integer.	0	Set the upper comparison value.
Input > Window Compare > Window Mode	Disabled Enabled	Disabled	When disabled, ADC values will be compared only with the lower reference on each comparator. When enabled, both the lower and upper reference values will be used to create a comparison window.
Input > Window Compare > Event Output	OR XOR AND	OR	Select how comparison results should be composited for event output.
Input > Start Trigger > Group A	Refer to the RZN Configuration tool for available options.	Disabled	A/D Conversion Start Trigger Select for Group A.
Input > Start Trigger > Group B	Refer to the RZN Configuration tool for available options.	Disabled	A/D Conversion Start Trigger Select for Group B.
Input > Start Trigger > Group C Enabled	Disabled Enabled	Disabled	Set to true to enable Group C, false to disable Group C.
Input > Start Trigger > Group C	Refer to the RZN Configuration tool for available options.	Disabled	A/D Conversion Start Trigger Select for Group C.
Input > Channel Scan Mask (channel availability varies by MPU)	Refer to the RZN Configuration tool for available options.		In Normal mode of operation, this bitmask field specifies the channels that are enabled in that ADC unit. In group mode, this field specifies which channels belong to group A.
Input > Group B Scan Mask (channel availability varies by MPU)	Refer to the RZN Configuration tool for available options.		In group mode, this field specifies which channels belong to group B.
Input > Add/Average Count	Disabled Add two samples Add three samples Add four samples Add sixteen samples Average two samples Average four samples	Disabled	Specifies if addition or averaging needs to be done for any of the channels in this unit.
Input > Addition/Averaging Mask (channel availability varies by MPU and unit)	Refer to the RZN Configuration tool for available options.		Select channels to include in the Addition/Averaging Mask
Input > Group C Scan Mask (channel availability varies by MPU)	Refer to the RZN Configuration tool for available options.		In group mode, this field specifies which channels belong to group C.
Interrupts > Normal/Group A Trigger	MCU Specific Options		Specifies the trigger type to be used for this unit. Triggers that specify ADC Unit must be selected for correct ADC unit to operate correctly.
Interrupts > Group B Trigger	MCU Specific Options		Specifies the trigger for Group B scanning in group scanning mode. This event is also used to trigger Group A in extended double-trigger mode. Triggers that specify ADC Unit must be selected for correct ADC unit to operate correctly.
Interrupts > Group Priority (Valid only in Group Scan Mode)	Refer to the RZN Configuration tool for available options.	Group A ignored and does not interrupt Group B and Group C	Determines whether an ongoing group B and group C scan can be interrupted by a group A trigger, whether it should abort on a group A trigger, or if it should pause to allow group A scan and restart immediately after group A scan is complete.
Interrupts > Callback	Name must be a valid C symbol	NULL	A user callback function. If this callback function is provided, it is called from the interrupt service routine (ISR) each time the ADC scan completes.
Interrupts > Scan End Interrupt Priority	MCU Specific Options		Select scan end interrupt priority.
Interrupts > Scan End Group B Interrupt Priority	MCU Specific Options		Select group B scan end interrupt priority.
Interrupts > Scan End Group C Interrupt Priority	MCU Specific Options		Select group C scan end interrupt priority.
Interrupts > Window Compare A Interrupt Priority	MCU Specific Options		Select Window Compare A interrupt priority.
Interrupts > Window Compare B Interrupt Priority	MCU Specific Options		Select Window Compare B interrupt priority.
ELC > ADC0 event A > Trigger Source	MCU Specific Options		ELC_SSEL settings.
ELC > ADC0 event B > Trigger Source	MCU Specific Options		ELC_SSEL settings.
ELC > ADC1 event A > Trigger Source	MCU Specific Options		ELC_SSEL settings.
ELC > ADC1 event B > Trigger Source	MCU Specific Options		ELC_SSEL settings.
ELC > ADC2 event A > Trigger Source	MCU Specific Options		ELC_SSEL settings.
ELC > ADC2 event B > Trigger Source	MCU Specific Options		ELC_SSEL settings.
ELC > Output Event Signal	Single Contiuous Group A Group B Group A or B or C Group C	Single	A/D Event Link Control.

Clock Configuration

For N2L device

• Peripheral module clock (Unit 0: PCLKH, Unit 1: PCLKL) and A/D conversion clock PCLKADC can be set with the following division ratios: ICLK to PCLKADC frequency ratios = 8:1.
• The ADC clock must be at 25 MHz or 18.75 MHz (ICLK/8) when the ADC is used.

For N2H device

• Peripheral module clock (Unit 0: PCLKH, Unit 1: PCLKH, Unit 2: PCLKM) and A/D conversion clock PCLKADC can be set with the following division ratios: PCLKH to PCLKADC frequency ratios = 4:1.
• The ADC clock must be at 62.5 MHz (PCLKH/4) when the ADC is used.

Pin Configuration

The ANxxx pins are analog input channels that can be used with the ADC.

ADTRG0 and ADTRG1 can be used to start scans with an external trigger for unit 0 and 1 respectively. When external triggers are used, ADC scans begin on the falling edge of the ADTRG pin.

Usage Notes

Sample Hold

Enabling the sample and hold functionality reduces the maximum scan frequency because the sample and hold time is added to each scan. Refer to the hardware manual for details on the sample and hold time.

ADC Operational Modes

The driver supports three operation modes: single-scan, continuous-scan, and group-scan modes. In each mode, analog channels are converted in ascending order of channel number, followed by scans of the voltage sensor if they are included in the mask of channels to scan.

Single-scan Mode

In single scan mode, one or more specified channels are scanned once per trigger.

Continuous-scan Mode

In continuous scan mode, a single trigger is required to start the scan. Scans continue until R_ADC_ScanStop() is called.

Group-scan Mode

Group-scan mode allows the application to allocate channels to one of two groups (A and B and C). Conversion begins when the specified ELC start trigger for that group is received.

The priority of group priority operations is group A > group B > group C. In group priority operation, if the scan start of group B is accepted during the scan of group C, the scan of group C is interrupted and the scan of group B is started. If the scan start of group A is accepted during the scan of group C, the scan of group A is started. The scan of Group C is interrupted and the scan of Group A is started. Similarly, if the scan start of Group A is accepted during the scan of Group B, the scan of Group B is interrupted and the scan of Group A is started. The interrupted group scan is able to resume after the priority group scan is complete also.:

• To restart the interrupted group B scan after the group A scan completes.
• To wait for another group B trigger and forget the interrupted scan.
• To continuously scan group B and suspend scanning group B only when a group A trigger is received.

  Note

  If this option is selected, group B scanning begins immediately after R_ADC_ScanCfg(). Group A scan triggers must be enabled by R_ADC_ScanStart() and can be disabled by R_ADC_ScanStop(). Group B scans can only be disabled by reconfiguring the group A priority to a different mode.

  
  

Double-triggering

When double-triggering is enabled a single channel is selected to be scanned twice before an interrupt is thrown. The first scan result when using double-triggering is always saved to the selected channel's data register. The second result is saved to the data duplexing register (ADC_CHANNEL_DUPLEX).

Double-triggering uses Group A; only one channel can be selected when enabled. No other scanning is possible on Group A while double-trigger mode is selected.

When extended double-triggering is enabled, both ADC input (ELC) events are routed to Group A. The interrupt is still thrown after every two scans regardless of the triggering event(s). While the first and second scan are saved to the selected ADC data register and the ADC duplexing register as before, scans associated with event A and B are additionally copied into duplexing register A and B, respectively (ADC_CHANNEL_DUPLEX_A and ADC_CHANNEL_DUPLEX_B).

Window Compare Function

The ADC contains comparators that allow scan data to be compared to user-provided reference values. When a value meets the configured condition an interrupt and/or an ELC event can be produced.

Each unit has two configurable comparison units, Window A and Window B. Window A allows for configuring multiple simultaneous channels to compare while Window B only allows one channel at a time.

The window compare function can be configured both through the FSP Configuration tool and at runtime by providing a pointer to an st_adc_window_cfg struct to st_adc_channel_cfg::p_window_cfg when calling R_ADC_ScanCfg. The available comparison modes are shown below:

Window setting	Channel mode 0	Channel mode 1
Disabled	Scan < Low Ref	Scan > Low Ref
Enabled	(Scan < Low Ref) OR (Scan > High Ref)	Low Ref < Scan < High Ref

Note

The window setting applies to all channels configured on a unit.

Event Output Function

To use the event output of compare function, Set the mode of operation to Single Scan Mode. The compare function can be configured by enabling both Window A and Window B. In Window A, any channel from unit support can be selected. In Window B, one channel of unit support can be selected.

Note

: When using event output using only window A of compare function, please follow the step below.

• Enable both Window A and Window B.
• Select "OR condition" for compound condition setting for Window A and Window B.
• Set channel in Window B to "Unselected".
• Set the comparison condition of window B to 0 < conversion result < 0, which is "always inconsistent".

Sample-State Count Setting

The application program can modify the setting of the sample-state count for analog channels by calling the R_ADC_SampleStateCountSet() API function. The application program only needs to modify the sample-state count settings from their default values to increase the sampling time. This can be either because the impedance of the input signal is too high to secure sufficient sampling time under the default setting or if the ADCLK is too slow. To modify the sample-state count for a given channel, set the channel number and the number of states when calling the R_ADC_SampleStateCountSet() API function. Valid sample state counts are 8-255.

If the sample state count needs to be changed for multiple channels, the application program must call the R_ADC_SampleStateCountSet() API function repeatedly, with appropriately modified arguments for each channel.

If the ADCLK frequency changes, the sample states may need to be updated.

Selecting Reference Voltage

The ADC12 can select VREFH0 or VREFH1 as the high-potential reference voltage on selected MPU's.

Usage Notes for ADC12

Range of ADC12 Results

The range of the ADC12 is from 0 (lowest) to 0xFFF (highest) when used in single-ended mode. This driver only supports single ended mode.

Limitations

Developers should be aware of the following limitations when using the ADC:

• When using the Window Compare function:
  • Only Single Scan mode may be configured when match or mismatch ELC events are used.
  • Both windows cannot reference the same channel.

Examples

Basic Example

This is a basic example of minimal use of the ADC in an application.

/* A channel configuration is generated by the FSP Configuration editor based on the options selected.  If additional
 * configurations are desired additional adc_channel_cfg_t elements can be defined and passed to R_ADC_ScanCfg. */
const adc_channel_cfg_t g_adc0_channel_cfg =
{
    .scan_mask          = ADC_MASK_CHANNEL_0 | ADC_MASK_CHANNEL_1,
    .scan_mask_group_b  = 0,
    .priority_group_a   = (adc_group_a_t) 0,
    .add_mask           = 0,
    .sample_hold_mask   = 0,
    .sample_hold_states = 0,
};

void adc_basic_example (void)
{
    fsp_err_t err = FSP_SUCCESS;

    /* Initializes the module. */
    err = R_ADC_Open(&g_adc0_ctrl, &g_adc0_cfg);

    /* Handle any errors. This function should be defined by the user. */
    assert(FSP_SUCCESS == err);

    /* Enable channels. */
    err = R_ADC_ScanCfg(&g_adc0_ctrl, &g_adc0_channel_cfg);
    assert(FSP_SUCCESS == err);

    /* In software trigger mode, start a scan by calling R_ADC_ScanStart(). In other modes, enable external
     * triggers by calling R_ADC_ScanStart(). */
    (void) R_ADC_ScanStart(&g_adc0_ctrl);

    /* Wait for conversion to complete. */
    adc_status_t status;
    status.state = ADC_STATE_SCAN_IN_PROGRESS;
    while (ADC_STATE_SCAN_IN_PROGRESS == status.state)
    {
        (void) R_ADC_StatusGet(&g_adc0_ctrl, &status);
    }

    /* Read converted data. */
    uint16_t channel1_conversion_result;
    err = R_ADC_Read(&g_adc0_ctrl, ADC_CHANNEL_1, &channel1_conversion_result);
    assert(FSP_SUCCESS == err);
}

Double-Trigger Example

This example demonstrates reading data from a double-trigger scan. A flag is used to wait for a callback event. Two scans must occur before the callback is called. These results are read via R_ADC_Read using the selected channel enum value as well as ADC_CHANNEL_DUPLEX.

volatile bool scan_complete_flag = false;

void adc_callback (adc_callback_args_t * p_args)
{
    FSP_PARAMETER_NOT_USED(p_args);

    scan_complete_flag = true;
}

void adc_double_trigger_example (void)
{
    fsp_err_t err = FSP_SUCCESS;

    /* Initialize the module. */
    err = R_ADC_Open(&g_adc0_ctrl, &g_adc0_cfg);

    /* Handle any errors. This function should be defined by the user. */
    assert(FSP_SUCCESS == err);

    /* Enable double-trigger channel. */
    err = R_ADC_ScanCfg(&g_adc0_ctrl, &g_adc0_channel_cfg);
    assert(FSP_SUCCESS == err);

    /* Enable scan triggering from ELC events. */
    (void) R_ADC_ScanStart(&g_adc0_ctrl);

    /* Wait for conversion to complete. Two scans must be triggered before a callback occurs. */
    scan_complete_flag = false;
    while (!scan_complete_flag)
    {
        /* Wait for callback to set flag. */
    }

    /* Read converted data from both scans. */
    uint16_t channel1_conversion_result_0;
    uint16_t channel1_conversion_result_1;
    err = R_ADC_Read(&g_adc0_ctrl, ADC_CHANNEL_1, &channel1_conversion_result_0);
    assert(FSP_SUCCESS == err);
    err = R_ADC_Read(&g_adc0_ctrl, ADC_CHANNEL_DUPLEX, &channel1_conversion_result_1);
    assert(FSP_SUCCESS == err);
}

Window Compare Example

This example shows how to configure the window compare function at runtime as well as how to handle events and obtain comparison results through a callback.

adc_window_cfg_t g_adc0_window_cfg =
{
    /* Enable Window A and Window B; enable Window mode */
    .compare_cfg        =
        (adc_compare_cfg_t) (ADC_COMPARE_CFG_A_ENABLE | ADC_COMPARE_CFG_B_ENABLE | ADC_COMPARE_CFG_WINDOW_ENABLE),

    /* Compare scan values from Channels 0 and 1 */
    .compare_mask       = ADC_MASK_CHANNEL_0 | ADC_MASK_CHANNEL_1,

    /* Set Channel 1 condition to be inside the window instead of outside */
    .compare_mode_mask  = ADC_MASK_CHANNEL_1,

    /* Set reference voltage levels for Window A */
    .compare_ref_low  = ADC_SCAN_MAX / 3,
    .compare_ref_high = ADC_SCAN_MAX * 2 / 3,

    /* Configure Window B to compare Channel 2 (inside window) */
    .compare_b_channel = ADC_WINDOW_B_CHANNEL_2,
    .compare_b_mode    = ADC_WINDOW_B_MODE_GREATER_THAN_OR_INSIDE,

    /* Set reference voltage levels for Window B */
    .compare_b_ref_low  = ADC_SCAN_MAX / 4,
    .compare_b_ref_high = ADC_SCAN_MAX * 3 / 4,
};

void adc0_callback (adc_callback_args_t * p_args)
{
    if (ADC_EVENT_WINDOW_COMPARE_A == p_args->event)
    {
        /* Get channel that met the comparison criteria */
        adc_channel_t channel = p_args->channel;

        /* Process event here */
        FSP_PARAMETER_NOT_USED(channel);
    }
    else if (ADC_EVENT_WINDOW_COMPARE_B == p_args->event)
    {
        /* Process Window B events here */
    }
    else
    {
        /* ... */
    }
}

void adc_window_compare_example (void)
{
    fsp_err_t err = FSP_SUCCESS;

    /* Open the ADC module */
    err = R_ADC_Open(&g_adc0_ctrl, &g_adc0_cfg);
    assert(FSP_SUCCESS == err);

    /* Set the window compare configuration in the channel config */
    g_adc0_channel_runtime_cfg.p_window_cfg = &g_adc0_window_cfg;

    /* The window compare function is configured as part of the scan configuration */
    err = R_ADC_ScanCfg(&g_adc0_ctrl, &g_adc0_channel_runtime_cfg);
    assert(FSP_SUCCESS == err);

    /* Main program loop - scan the ADC every second */
    while (1)
    {
        /* Start a scan */
        err = R_ADC_ScanStart(&g_adc0_ctrl);
        assert(FSP_SUCCESS == err);

        /* Delay; any compare events will be handled by the callback */
        R_BSP_SoftwareDelay(1, BSP_DELAY_UNITS_SECONDS);
    }
}

Classes
struct	st_adc_instance_ctrl

Typedefs
typedef struct st_adc_instance_ctrl	adc_instance_ctrl_t

---

Class Documentation

RZN::st_adc_instance_ctrl

struct RZN::st_adc_instance_ctrl

ADC instance control block. DO NOT INITIALIZE. Initialized in RZN::adc_api_t::open().

Typedef Documentation

adc_instance_ctrl_t

typedef struct st_adc_instance_ctrl adc_instance_ctrl_t

ADC instance control block. DO NOT INITIALIZE. Initialized in RZN::adc_api_t::open(). Please refer to the struct st_adc_instance_ctrl.

Function Documentation

R_ADC_Open()

fsp_err_t R_ADC_Open	(	adc_ctrl_t *	p_ctrl,
		adc_cfg_t const *const	p_cfg
	)

Sets the operational mode, trigger sources, interrupt priority, and configurations for the peripheral as a whole. If interrupt is enabled, the function registers a callback function pointer for notifying the user whenever a scan has completed.

Return values

FSP_SUCCESS	Module is ready for use.
FSP_ERR_ASSERTION	An input argument is invalid.
FSP_ERR_ALREADY_OPEN	The instance control structure has already been opened.
FSP_ERR_IRQ_BSP_DISABLED	A callback is provided, but the interrupt is not enabled.
FSP_ERR_IP_CHANNEL_NOT_PRESENT	The requested unit does not exist on this MPU.
FSP_ERR_INVALID_HW_CONDITION	The ADC clock must be at least 1 MHz

R_ADC_ScanCfg()

fsp_err_t R_ADC_ScanCfg	(	adc_ctrl_t *	p_ctrl,
		void const *const	p_channel_cfg
	)

Configures the ADC scan parameters. Channel specific settings are set in this function. Pass a pointer to st_adc_channel_cfg to p_channel_cfg.

Note

This starts group B scans if adc_channel_cfg_t::priority_group_a is set to ADC_GRPA_GRPB_GRPC_TOP_CONT_SCAN.

Return values

FSP_SUCCESS	Channel specific settings applied.
FSP_ERR_ASSERTION	An input argument is invalid.
FSP_ERR_NOT_OPEN	Unit is not open.

R_ADC_CallbackSet()

fsp_err_t R_ADC_CallbackSet	(	adc_ctrl_t *const	p_ctrl,
		void(*)(adc_callback_args_t *)	p_callback,
		void *const	p_context,
		adc_callback_args_t *const	p_callback_memory
	)

Updates the user callback and has option of providing memory for callback structure. Implements adc_api_t::callbackSet

Return values

FSP_SUCCESS	Callback updated successfully.
FSP_ERR_ASSERTION	A required pointer is NULL.
FSP_ERR_NOT_OPEN	The control block has not been opened.

R_ADC_ScanStart()

fsp_err_t R_ADC_ScanStart

(

adc_ctrl_t *

p_ctrl

)

Starts a software scan or enables the hardware trigger for a scan depending on how the triggers were configured in the R_ADC_Open call. If the unit was configured for ELC or external hardware triggering, then this function allows the trigger signal to get to the ADC unit. The function is not able to control the generation of the trigger itself. If the unit was configured for software triggering, then this function starts the software triggered scan.

Precondition

Call R_ADC_ScanCfg after R_ADC_Open before starting a scan.

Return values

FSP_SUCCESS	Scan started (software trigger) or hardware triggers enabled.
FSP_ERR_ASSERTION	An input argument is invalid.
FSP_ERR_NOT_OPEN	Unit is not open.
FSP_ERR_NOT_INITIALIZED	Unit is not initialized.
FSP_ERR_IN_USE	Another scan is still in progress (software trigger).

R_ADC_ScanGroupStart()

fsp_err_t R_ADC_ScanGroupStart	(	adc_ctrl_t *	p_ctrl,
		adc_group_mask_t	group_mask
	)

RZN::adc_api_t::scanGroupStart is not supported on the ADC. Use scanStart instead.

Return values

FSP_ERR_UNSUPPORTED

Function not supported in this implementation.

R_ADC_ScanStop()

fsp_err_t R_ADC_ScanStop

(

adc_ctrl_t *

p_ctrl

)

Stops the software scan or disables the unit from being triggered by the hardware trigger (ELC or external) based on what type of trigger the unit was configured for in the R_ADC_Open function. Stopping a hardware triggered scan via this function does not abort an ongoing scan, but prevents the next scan from occurring. Stopping a software triggered scan aborts an ongoing scan.

Return values

FSP_SUCCESS	Scan stopped (software trigger) or hardware triggers disabled.
FSP_ERR_ASSERTION	An input argument is invalid.
FSP_ERR_NOT_OPEN	Unit is not open.
FSP_ERR_NOT_INITIALIZED	Unit is not initialized.

R_ADC_StatusGet()

fsp_err_t R_ADC_StatusGet	(	adc_ctrl_t *	p_ctrl,
		adc_status_t *	p_status
	)

Provides the status of any scan process that was started, including scans started by ELC or external triggers.

Return values

FSP_SUCCESS	Module status stored in the provided pointer p_status
FSP_ERR_ASSERTION	An input argument is invalid.
FSP_ERR_NOT_OPEN	Unit is not open.

R_ADC_Read()

fsp_err_t R_ADC_Read	(	adc_ctrl_t *	p_ctrl,
		adc_channel_t const	reg_id,
		uint16_t *const	p_data
	)

Reads conversion results from a single channel or sensor.

Return values

FSP_SUCCESS	Data read into provided p_data.
FSP_ERR_ASSERTION	An input argument is invalid.
FSP_ERR_NOT_OPEN	Unit is not open.
FSP_ERR_NOT_INITIALIZED	Unit is not initialized.

R_ADC_Read32()

fsp_err_t R_ADC_Read32	(	adc_ctrl_t *	p_ctrl,
		adc_channel_t const	reg_id,
		uint32_t *const	p_data
	)

Reads conversion results from a single channel or sensor register into a 32-bit result.

Return values

FSP_SUCCESS	Data read into provided p_data.
FSP_ERR_ASSERTION	An input argument is invalid.
FSP_ERR_NOT_OPEN	Unit is not open.
FSP_ERR_NOT_INITIALIZED	Unit is not initialized.

R_ADC_SampleStateCountSet()

fsp_err_t R_ADC_SampleStateCountSet	(	adc_ctrl_t *	p_ctrl,
		adc_sample_state_t *	p_sample
	)

Sets the sample state count for individual channels. This only needs to be set for special use cases. Normally, use the default values out of reset.

Note

The sample states for the temperature and voltage sensor are set in R_ADC_ScanCfg.

Return values

FSP_SUCCESS	Sample state count updated.
FSP_ERR_ASSERTION	An input argument is invalid.
FSP_ERR_NOT_OPEN	Unit is not open.
FSP_ERR_NOT_INITIALIZED	Unit is not initialized.

R_ADC_InfoGet()

fsp_err_t R_ADC_InfoGet	(	adc_ctrl_t *	p_ctrl,
		adc_info_t *	p_adc_info
	)

Returns the address of the lowest number configured channel and the total number of bytes to be read in order to read the results of the configured channels and return the ELC Event name. If no channels are configured, then a length of 0 is returned.

Note

In group mode, information is returned for group A only. Calculating information for group B is not currently supported.

Return values

FSP_SUCCESS	Information stored in p_adc_info.
FSP_ERR_ASSERTION	An input argument is invalid.
FSP_ERR_NOT_OPEN	Unit is not open.

R_ADC_Close()

fsp_err_t R_ADC_Close

(

adc_ctrl_t *

p_ctrl

)

This function ends any scan in progress, disables interrupts, and removes power to the A/D peripheral.

Return values

FSP_SUCCESS	Module closed.
FSP_ERR_ASSERTION	An input argument is invalid.
FSP_ERR_NOT_OPEN	Unit is not open.

R_ADC_Calibrate()

fsp_err_t R_ADC_Calibrate	(	adc_ctrl_t *const	p_ctrl,
		void const *	p_extend
	)

adc_api_t::calibrate is not supported on the ADC.

Return values

FSP_ERR_UNSUPPORTED

Function not supported in this implementation.

R_ADC_OffsetSet()

fsp_err_t R_ADC_OffsetSet	(	adc_ctrl_t *const	p_ctrl,
		adc_channel_t const	reg_id,
		int32_t	offset
	)

adc_api_t::offsetSet is not supported on the ADC.

Return values

FSP_ERR_UNSUPPORTED

Function not supported in this implementation.