Analog to Digital Converter (r_adc)

Functions
fsp_err_t	R_ADC_Open (adc_ctrl_t *p_ctrl, adc_cfg_t const *const p_cfg)
fsp_err_t	R_ADC_ScanCfg (adc_ctrl_t *p_ctrl, void const *const p_channel_cfg)
fsp_err_t	R_ADC_InfoGet (adc_ctrl_t *p_ctrl, adc_info_t *p_adc_info)
fsp_err_t	R_ADC_ScanStart (adc_ctrl_t *p_ctrl)
fsp_err_t	R_ADC_ScanGroupStart (adc_ctrl_t *p_ctrl, adc_group_mask_t group_mask)
fsp_err_t	R_ADC_ScanStop (adc_ctrl_t *p_ctrl)
fsp_err_t	R_ADC_StatusGet (adc_ctrl_t *p_ctrl, adc_status_t *p_status)
fsp_err_t	R_ADC_Read (adc_ctrl_t *p_ctrl, adc_channel_t const reg_id, uint16_t *const p_data)
fsp_err_t	R_ADC_Read32 (adc_ctrl_t *p_ctrl, adc_channel_t const reg_id, uint32_t *const p_data)
fsp_err_t	R_ADC_SampleStateCountSet (adc_ctrl_t *p_ctrl, adc_sample_state_t *p_sample)
fsp_err_t	R_ADC_Close (adc_ctrl_t *p_ctrl)
fsp_err_t	R_ADC_OffsetSet (adc_ctrl_t *const p_ctrl, adc_channel_t const reg_id, int32_t offset)
fsp_err_t	R_ADC_Calibrate (adc_ctrl_t *const p_ctrl, void const *p_extend)
fsp_err_t	R_ADC_CallbackSet (adc_ctrl_t *const p_ctrl, void(*p_callback)(adc_callback_args_t *), void const *const p_context, adc_callback_args_t *const p_callback_memory)

Detailed Description

Driver for the and ADC12 peripherals on RZ microprocessor. This module implements the ADC Interface.

Overview

Features

The ADC module supports the following features:

• 12 bit maximum resolution depending on the MCU
• Configure scans to include:
  • Multiple analog channels
• Configurable scan start trigger:
  • Software scan triggers
  • Hardware scan triggers (timer expiration, for example)
  • External scan triggers from the ADTRGn port pins
• Configurable scan mode:
  • Single scan mode, where each trigger starts a single scan
  • Continuous scan mode, where all channels are scanned continuously
  • Group scan mode, where channels are grouped into group A and group B and group C. The groups can be assigned different start triggers, and group A can be given priority over group B. When group A has priority over group B, a group A trigger suspends an ongoing group B scan.
• Supports adding and averaging converted samples
• Optional callback when scan completes
• Supports reading converted data
• Sample and hold support
• Double-trigger support

Configuration

Build Time Configurations for r_adc

The following build time configurations are defined in fsp_cfg/r_adc_cfg.h:

Configuration	Options	Default	Description
Parameter Checking	Default (BSP) Enabled Disabled	Default (BSP)	If selected code for parameter checking is included in the build.
Multiplex Interrupt	Enabled Disabled	Disabled	Enable multiplex interrupt system-wide.

Configurations for Analog > ADC (r_adc)

This module can be added to the Stacks tab via New Stack > Analog > ADC (r_adc).

Configuration	Options	Default	Description
General > Name	Name must be a valid C symbol	g_adc0	Module name
General > Unit	Unit must be a non-negative integer	0	Specifies the ADC Unit to be used.
General > Clear after read	Off On	On	Specifies if the result register will be automatically cleared after the conversion result is read.
General > Mode	Single Scan Continuous Scan Group Scan	Single Scan	Specifies the mode that this ADC unit is used in.
General > Double-trigger	Disabled Enabled Enabled (extended mode)	Disabled	When enabled, the scan-end interrupt for Group A is only thrown on every second scan. Extended double-trigger mode (single-scan only) triggers on both ELC events, allowing (for example) a scan on two different timer compare match values. In group mode Group B is unaffected.
Input > Sample and Hold > Sample and Hold Channels (Available only on selected MCUs)	Channel 0 Channel 1 Channel 2		Specifies if this channel is included in the Sample and Hold Mask.
Input > Sample and Hold > Sample Hold States (Applies only to channels 0, 1, 2)	Must be a valid non-negative integer with configurable value 4 to 255	24	Specifies the updated sample-and-hold count for the channel dedicated sample-and-hold circuit
Input > Window Compare > Window A > Enable	MCU Specific Options		Enable or disable comparison with Window A.
Input > Window Compare > Window A > Channels to compare (channel availability varies by MCU and unit)	Refer to the RZT Configuration tool for available options.		Select channels to be compared to Window A.
Input > Window Compare > Window A > Channel comparison mode (channel availability varies by MCU and unit)	Refer to the RZT Configuration tool for available options.		Checking a box sets the comparison mode for that channel to Greater Than or Inside Window depending on whether Window Mode is disabled or enabled (respectively). If left unchecked the comparison mode will likewise be Less Than or Outside Window (respectively).
Input > Window Compare > Window A > Lower Reference	Must be a positive 16-bit integer.	0	Set the lower comparison value.
Input > Window Compare > Window A > Upper Reference	Must be a positive 16-bit integer.	0	Set the upper comparison value.
Input > Window Compare > Window B > Enable	MCU Specific Options		Enable or disable comparison with Window B.
Input > Window Compare > Window B > Channel to compare (channel availability varies by MCU and unit)	MCU Specific Options		Select a channel to be compared to Window B.
Input > Window Compare > Window B > Comparison mode	Less Than or Outside Window Greater Than or Inside Window	module.driver.adc.compare.window_b.mode	Select the comparison mode for Window B. For each option, the first condition applies when Window Mode is disabled and the second option applies when Window Mode is enabled.
Input > Window Compare > Window B > Lower Reference	Must be a positive 16-bit integer.	0	Set the lower comparison value.
Input > Window Compare > Window B > Upper Reference	Must be a positive 16-bit integer.	0	Set the upper comparison value.
Input > Window Compare > Window Mode	Disabled Enabled	Disabled	When disabled, ADC values will be compared only with the lower reference on each comparator. When enabled, both the lower and upper reference values will be used to create a comparison window.
Input > Start Trigger > Group A	Refer to the RZT Configuration tool for available options.	Disabled	A/D Conversion Start Trigger Select for Group A.
Input > Start Trigger > Group B	Refer to the RZT Configuration tool for available options.	Disabled	A/D Conversion Start Trigger Select for Group B.
Input > Start Trigger > Group C Enabled	Disabled Enabled	Disabled	Set to true to enable Group C, false to disable Group C.
Input > Start Trigger > Group C	Refer to the RZT Configuration tool for available options.	Disabled	A/D Conversion Start Trigger Select for Group C.
Input > Channel Scan Mask (channel availability varies by MCU)	Refer to the RZT Configuration tool for available options.		In Normal mode of operation, this bitmask field specifies the channels that are enabled in that ADC unit. In group mode, this field specifies which channels belong to group A.
Input > Group B Scan Mask (channel availability varies by MCU)	Refer to the RZT Configuration tool for available options.		In group mode, this field specifies which channels belong to group B.
Input > Add/Average Count	Disabled Add two samples Add three samples Add four samples Add sixteen samples Average two samples Average four samples	Disabled	Specifies if addition or averaging needs to be done for any of the channels in this unit.
Input > Addition/Averaging Mask (channel availability varies by MCU and unit)	Refer to the RZT Configuration tool for available options.		Select channels to include in the Addition/Averaging Mask
Input > Group C Scan Mask (channel availability varies by MCU)	Refer to the RZT Configuration tool for available options.		In group mode, this field specifies which channels belong to group C.
Interrupts > Normal/Group A Trigger	MCU Specific Options		Specifies the trigger type to be used for this unit.
Interrupts > Group B Trigger	MCU Specific Options		Specifies the trigger for Group B scanning in group scanning mode. This event is also used to trigger Group A in extended double-trigger mode.
Interrupts > Group Priority (Valid only in Group Scan Mode)	Group A cannot interrupt Group B Group A can interrupt Group B; Group B scan restarts at next trigger Group A can interrupt Group B; Group B scan restarts immediately Group A can interrupt Group B; Group B scan restarts immediately and scans continuously	Group A cannot interrupt Group B	Determines whether an ongoing group B scan can be interrupted by a group A trigger, whether it should abort on a group A trigger, or if it should pause to allow group A scan and restart immediately after group A scan is complete.
Interrupts > Callback	Name must be a valid C symbol	NULL	A user callback function. If this callback function is provided, it is called from the interrupt service routine (ISR) each time the ADC scan completes.
Interrupts > Scan End Interrupt Priority	MCU Specific Options		Select scan end interrupt priority.
Interrupts > Scan End Group B Interrupt Priority	MCU Specific Options		Select group B scan end interrupt priority.
Interrupts > Scan End Group C Interrupt Priority	MCU Specific Options		Select group C scan end interrupt priority.
Interrupts > Window Compare A Interrupt Priority	MCU Specific Options		Select Window Compare A interrupt priority.
Interrupts > Window Compare B Interrupt Priority	MCU Specific Options		Select Window Compare B interrupt priority.
ELC > ADC0 event A > Trigger Source	MCU Specific Options		ELC_SSEL settings.
ELC > ADC0 event B > Trigger Source	MCU Specific Options		ELC_SSEL settings.
ELC > ADC1 event A > Trigger Source	MCU Specific Options		ELC_SSEL settings.
ELC > ADC1 event B > Trigger Source	MCU Specific Options		ELC_SSEL settings.
ELC > ADC2 event A > Trigger Source	MCU Specific Options		ELC_SSEL settings.
ELC > ADC2 event B > Trigger Source	MCU Specific Options		ELC_SSEL settings.
ELC > Output Event Signal	Single Contiuous Group A Group B Group A or B or C Group C	Single	A/D Event Link Control.

Clock Configuration

Peripheral module clock (Unit 0: PCLKH, Unit 1: PCLKL) and A/D conversion clock PCLKADC can be set with the following division ratios: PCLKH to PCLKADC frequency ratios = 8:1

The ADC clock must be at 25 MHz or 18.75 MHz (ICLK/8) when the ADC is used.

For T2H device

Peripheral module clock (Unit 0: PCLKH, Unit 1: PCLKH, Unit 2: PCLKM) and A/D conversion clock PCLKADC can be set with the following division ratios: PCLKH to PCLKADC frequency ratios = 4:1

The ADC clock must be at 62.5 MHz (PCLKH/4) when the ADC is used.

Pin Configuration

The ANxxx pins are analog input channels that can be used with the ADC.

ADTRG0 and ADTRG1 can be used to start scans with an external trigger for unit 0 and 1 respectively. When external triggers are used, ADC scans begin on the falling edge of the ADTRG pin.

Usage Notes

Sample Hold

Enabling the sample and hold functionality reduces the maximum scan frequency because the sample and hold time is added to each scan. Refer to the hardware manual for details on the sample and hold time.

ADC Operational Modes

The driver supports three operation modes: single-scan, continuous-scan, and group-scan modes. In each mode, analog channels are converted in ascending order of channel number, followed by scans of the voltage sensor if they are included in the mask of channels to scan.

Single-scan Mode

In single scan mode, one or more specified channels are scanned once per trigger.

Continuous-scan Mode

In continuous scan mode, a single trigger is required to start the scan. Scans continue until R_ADC_ScanStop() is called.

Group-scan Mode

Group-scan mode allows the application to allocate channels to one of two groups (A and B and C). Conversion begins when the specified ELC start trigger for that group is received.

The priority of group priority operations is group A > group B > group C. In group priority operation, if the scan start of group B is accepted during the scan of group C, the scan of group C is interrupted and the scan of group B is started. If the scan start of group A is accepted during the scan of group C, the scan of group A is started. The scan of Group C is interrupted and the scan of Group A is started. Similarly, if the scan start of Group A is accepted during the scan of Group B, the scan of Group B is interrupted and the scan of Group A is started. The interrupted group scan is able to resume after the priority group scan is complete also.:

• To restart the interrupted group B scan after the group A scan completes.
• To wait for another group B trigger and forget the interrupted scan.
• To continuously scan group B and suspend scanning group B only when a group A trigger is received.

  Note

  If this option is selected, group B scanning begins immediately after R_ADC_ScanCfg(). Group A scan triggers must be enabled by R_ADC_ScanStart() and can be disabled by R_ADC_ScanStop(). Group B scans can only be disabled by reconfiguring the group A priority to a different mode.

  
  

Double-triggering

When double-triggering is enabled a single channel is selected to be scanned twice before an interrupt is thrown. The first scan result when using double-triggering is always saved to the selected channel's data register. The second result is saved to the data duplexing register (ADC_CHANNEL_DUPLEX).

Double-triggering uses Group A; only one channel can be selected when enabled. No other scanning is possible on Group A while double-trigger mode is selected.

When extended double-triggering is enabled both ADC input events are routed to Group A. The interrupt is still thrown after every two scans regardless of the triggering event(s). While the first and second scan are saved to the selected ADC data register and the ADC duplexing register as before, scans associated with event A and B are additionally copied into duplexing register A and B, respectively (ADC_CHANNEL_DUPLEX_A and ADC_CHANNEL_DUPLEX_B).

Window Compare Function

The ADC contains comparators that allow scan data to be compared to user-provided reference values. When a value meets the configured condition an interrupt and/or an ELC event can be produced.

Each unit has two configurable comparison units, Window A and Window B. Window A allows for configuring multiple simultaneous channels to compare while Window B only allows one channel at a time.

The window compare function can be configured both through the FSP Configuration tool and at runtime by providing a pointer to an adc_window_cfg_t struct to adc_channel_cfg_t::p_window_cfg when calling R_ADC_ScanCfg. The available comparison modes are shown below:

Window setting	Channel mode 0	Channel mode 1
Disabled	Scan < Low Ref	Scan > Low Ref
Enabled	(Scan < Low Ref) OR (Scan > High Ref)	Low Ref < Scan < High Ref

Note

The window setting applies to all channels configured on a unit.

Sample-State Count Setting

The application program can modify the setting of the sample-state count for analog channels by calling the R_ADC_SampleStateCountSet() API function. The application program only needs to modify the sample-state count settings from their default values to increase the sampling time. This can be either because the impedance of the input signal is too high to secure sufficient sampling time under the default setting or if the ADCLK is too slow. To modify the sample-state count for a given channel, set the channel number and the number of states when calling the R_ADC_SampleStateCountSet() API function. Valid sample state counts are 8-255.

If the sample state count needs to be changed for multiple channels, the application program must call the R_ADC_SampleStateCountSet() API function repeatedly, with appropriately modified arguments for each channel.

If the ADCLK frequency changes, the sample states may need to be updated.

Selecting Reference Voltage

The ADC12 can select VREFH0 or VREFH1 as the high-potential reference voltage on selected MCU's.

Usage Notes for ADC12

Range of ADC12 Results

The range of the ADC12 is from 0 (lowest) to 0xFFF (highest) when used in single-ended mode. This driver only supports single ended mode.

Examples

Basic Example

This is a basic example of minimal use of the ADC in an application.

/* A channel configuration is generated by the FSP Configuration editor based on the options selected.  If additional
 * configurations are desired additional adc_channel_cfg_t elements can be defined and passed to R_ADC_ScanCfg. */
const adc_channel_cfg_t g_adc0_channel_cfg =
{
    .scan_mask          = ADC_MASK_CHANNEL_0 | ADC_MASK_CHANNEL_1,
    .scan_mask_group_b  = 0,
    .priority_group_a   = (adc_group_a_t) 0,
    .add_mask           = 0,
    .sample_hold_mask   = 0,
    .sample_hold_states = 0,
};

void adc_basic_example (void)
{
    fsp_err_t err = FSP_SUCCESS;

    /* Initializes the module. */
    err = R_ADC_Open(&g_adc0_ctrl, &g_adc0_cfg);

    /* Handle any errors. This function should be defined by the user. */
    handle_error(err);

    /* Enable channels. */
    err = R_ADC_ScanCfg(&g_adc0_ctrl, &g_adc0_channel_cfg);
    handle_error(err);

    /* In software trigger mode, start a scan by calling R_ADC_ScanStart(). In other modes, enable external
     * triggers by calling R_ADC_ScanStart(). */
    (void) R_ADC_ScanStart(&g_adc0_ctrl);

    /* Wait for conversion to complete. */
    adc_status_t status;
    status.state = ADC_STATE_SCAN_IN_PROGRESS;
    while (ADC_STATE_SCAN_IN_PROGRESS == status.state)
    {
        (void) R_ADC_StatusGet(&g_adc0_ctrl, &status);
    }

    /* Read converted data. */
    uint16_t channel1_conversion_result;
    err = R_ADC_Read(&g_adc0_ctrl, ADC_CHANNEL_1, &channel1_conversion_result);
    handle_error(err);
}

Double-Trigger Example

This example demonstrates reading data from a double-trigger scan. A flag is used to wait for a callback event. Two scans must occur before the callback is called. These results are read via R_ADC_Read using the selected channel enum value as well as ADC_CHANNEL_DUPLEX.

volatile bool scan_complete_flag = false;

void adc_callback (adc_callback_args_t * p_args)
{
    FSP_PARAMETER_NOT_USED(p_args);

    scan_complete_flag = true;
}

void adc_double_trigger_example (void)
{
    fsp_err_t err = FSP_SUCCESS;

    /* Initialize the module. */
    err = R_ADC_Open(&g_adc0_ctrl, &g_adc0_cfg);

    /* Handle any errors. This function should be defined by the user. */
    handle_error(err);

    /* Enable double-trigger channel. */
    err = R_ADC_ScanCfg(&g_adc0_ctrl, &g_adc0_channel_cfg);
    handle_error(err);

    /* Enable scan triggering from ELC events. */
    (void) R_ADC_ScanStart(&g_adc0_ctrl);

    /* Wait for conversion to complete. Two scans must be triggered before a callback occurs. */
    scan_complete_flag = false;
    while (!scan_complete_flag)
    {
        /* Wait for callback to set flag. */
    }

    /* Read converted data from both scans. */
    uint16_t channel1_conversion_result_0;
    uint16_t channel1_conversion_result_1;
    err = R_ADC_Read(&g_adc0_ctrl, ADC_CHANNEL_1, &channel1_conversion_result_0);
    handle_error(err);
    err = R_ADC_Read(&g_adc0_ctrl, ADC_CHANNEL_DUPLEX, &channel1_conversion_result_1);
    handle_error(err);
}

Window Compare Example

This example shows how to configure the window compare function at runtime as well as how to handle events and obtain comparison results through a callback.

adc_window_cfg_t g_adc0_window_cfg =
{
    /* Enable Window A and Window B; enable Window mode */
    .compare_cfg        =
        (adc_compare_cfg_t) (ADC_COMPARE_CFG_A_ENABLE | ADC_COMPARE_CFG_B_ENABLE | ADC_COMPARE_CFG_WINDOW_ENABLE),

    /* Compare scan values from Channels 0 and 1 */
    .compare_mask       = ADC_MASK_CHANNEL_0 | ADC_MASK_CHANNEL_1,

    /* Set Channel 1 condition to be inside the window instead of outside */
    .compare_mode_mask  = ADC_MASK_CHANNEL_1,

    /* Set reference voltage levels for Window A */
    .compare_ref_low  = ADC_SCAN_MAX / 3,
    .compare_ref_high = ADC_SCAN_MAX * 2 / 3,

    /* Configure Window B to compare Channel 2 (inside window) */
    .compare_b_channel = ADC_WINDOW_B_CHANNEL_2,
    .compare_b_mode    = ADC_WINDOW_B_MODE_GREATER_THAN_OR_INSIDE,

    /* Set reference voltage levels for Window B */
    .compare_b_ref_low  = ADC_SCAN_MAX / 4,
    .compare_b_ref_high = ADC_SCAN_MAX * 3 / 4,
};

void adc0_callback (adc_callback_args_t * p_args)
{
    if (ADC_EVENT_WINDOW_COMPARE_A == p_args->event)
    {
        /* Get channel that met the comparison criteria */
        adc_channel_t channel = p_args->channel;

        /* Process event here */
        FSP_PARAMETER_NOT_USED(channel);
    }
    else if (ADC_EVENT_WINDOW_COMPARE_B == p_args->event)
    {
        /* Process Window B events here */
    }
    else
    {
        /* ... */
    }
}

void adc_window_compare_example (void)
{
    fsp_err_t err = FSP_SUCCESS;

    /* Open the ADC module */
    err = R_ADC_Open(&g_adc0_ctrl, &g_adc0_cfg);
    assert(FSP_SUCCESS == err);

    /* Set the window compare configuration in the channel config */
    g_adc0_channel_runtime_cfg.p_window_cfg = &g_adc0_window_cfg;

    /* The window compare function is configured as part of the scan configuration */
    err = R_ADC_ScanCfg(&g_adc0_ctrl, &g_adc0_channel_runtime_cfg);
    assert(FSP_SUCCESS == err);

    /* Main program loop - scan the ADC every second */
    while (1)
    {
        /* Start a scan */
        err = R_ADC_ScanStart(&g_adc0_ctrl);
        assert(FSP_SUCCESS == err);

        /* Delay; any compare events will be handled by the callback */
        R_BSP_SoftwareDelay(1, BSP_DELAY_UNITS_SECONDS);
    }
}

Data Structures
struct	adc_sample_state_t
struct	adc_window_cfg_t
struct	adc_extended_cfg_t
struct	adc_channel_cfg_t
struct	adc_instance_ctrl_t

Enumerations
enum	adc_mask_t
enum	adc_add_t
enum	adc_clear_t
enum	adc_sample_state_reg_t
enum	adc_compare_cfg_t
enum	adc_window_b_channel_t
enum	adc_window_b_mode_t
enum	adc_group_a_t
enum	adc_active_trigger_t
enum	adc_double_trigger_t
enum	adc_elc_t

---

Data Structure Documentation

adc_sample_state_t

struct adc_sample_state_t

ADC sample state configuration

Data Fields
adc_sample_state_reg_t	reg_id	Sample state register ID.
uint8_t	num_states	Number of sampling states for conversion. Ch16-20/21 use the same value.

adc_window_cfg_t

struct adc_window_cfg_t

ADC Window Compare configuration

Data Fields
uint32_t	compare_mask	Channel mask to compare with Window A.
uint32_t	compare_mode_mask	Per-channel condition mask for Window A.
adc_compare_cfg_t	compare_cfg	Window Compare configuration.
uint16_t	compare_ref_low	Window A lower reference value.
uint16_t	compare_ref_high	Window A upper reference value.
uint16_t	compare_b_ref_low	Window B lower reference value.
uint16_t	compare_b_ref_high	Window B upper reference value.
adc_window_b_channel_t	compare_b_channel	Window B channel.
adc_window_b_mode_t	compare_b_mode	Window B condition setting.

adc_extended_cfg_t

struct adc_extended_cfg_t

Extended configuration structure for ADC.

Data Fields
adc_add_t	add_average_count	Add or average samples.
adc_clear_t	clearing	Clear after read.
adc_trigger_t	trigger_group_b	Group B trigger source; valid only for group mode.
adc_double_trigger_t	double_trigger_mode	Double-trigger mode setting.
adc_active_trigger_t	adc_start_trigger_a	A/D Conversion Start Trigger Group A.
adc_active_trigger_t	adc_start_trigger_b	A/D Conversion Start Trigger Group B.
bool	adc_start_trigger_c_enabled	Set to true to enable Group C, false to disable Group C.
adc_active_trigger_t	adc_start_trigger_c	A/D Conversion Start Trigger Group C.
adc_elc_t	adc_elc_ctrl	A/D Event Link Control.
IRQn_Type	window_a_irq	IRQ number for Window Compare A interrupts.
uint8_t	window_a_ipl	Priority for Window Compare A interrupts.
IRQn_Type	window_b_irq	IRQ number for Window Compare B interrupts.
uint8_t	window_b_ipl	Priority for Window Compare B interrupts.

adc_channel_cfg_t

struct adc_channel_cfg_t

ADC channel(s) configuration

Data Fields
uint32_t	scan_mask	Channels/bits: bit 0 is ch0; bit 15 is ch15.
uint32_t	scan_mask_group_b	Valid for group modes.
uint32_t	scan_mask_group_c	Valid for group modes.
uint32_t	add_mask	Valid if add enabled in Open().
adc_window_cfg_t *	p_window_cfg	Pointer to Window Compare configuration.
adc_group_a_t	priority_group_a	Valid for group modes.
uint8_t	sample_hold_mask	Channels/bits 0-2.
uint8_t	sample_hold_states	Number of states to be used for sample and hold. Affects channels 0-2.

adc_instance_ctrl_t

struct adc_instance_ctrl_t

ADC instance control block. DO NOT INITIALIZE. Initialized in adc_api_t::open().

Enumeration Type Documentation

adc_mask_t

enum adc_mask_t

For ADC Scan configuration adc_channel_cfg_t::scan_mask, adc_channel_cfg_t::scan_mask_group_b, adc_channel_cfg_t::add_mask and adc_channel_cfg_t::sample_hold_mask. Use bitwise OR to combine these masks for desired channels and sensors.

Enumerator
ADC_MASK_OFF	No channels selected.
ADC_MASK_CHANNEL_0	Channel 0 mask.
ADC_MASK_CHANNEL_1	Channel 1 mask.
ADC_MASK_CHANNEL_2	Channel 2 mask.
ADC_MASK_CHANNEL_3	Channel 3 mask.
ADC_MASK_CHANNEL_4	Channel 4 mask.
ADC_MASK_CHANNEL_5	Channel 5 mask.
ADC_MASK_CHANNEL_6	Channel 6 mask.
ADC_MASK_CHANNEL_7	Channel 7 mask.
ADC_MASK_CHANNEL_8	Channel 8 mask.
ADC_MASK_CHANNEL_9	Channel 9 mask.
ADC_MASK_CHANNEL_10	Channel 10 mask.
ADC_MASK_CHANNEL_11	Channel 11 mask.
ADC_MASK_CHANNEL_12	Channel 12 mask.
ADC_MASK_CHANNEL_13	Channel 13 mask.
ADC_MASK_CHANNEL_14	Channel 14 mask.
ADC_MASK_CHANNEL_15	Channel 15 mask.

adc_add_t

enum adc_add_t

ADC data sample addition and averaging options

Enumerator
ADC_ADD_OFF	Addition turned off for channels/sensors.
ADC_ADD_TWO	Add two samples.
ADC_ADD_THREE	Add three samples.
ADC_ADD_FOUR	Add four samples.
ADC_ADD_SIXTEEN	Add sixteen samples.
ADC_ADD_AVERAGE_TWO	Average two samples.
ADC_ADD_AVERAGE_THREE	Average three samples.
ADC_ADD_AVERAGE_FOUR	Average four samples.
ADC_ADD_AVERAGE_SIXTEEN	Average sixteen samples.

adc_clear_t

enum adc_clear_t

ADC clear after read definitions

Enumerator
ADC_CLEAR_AFTER_READ_OFF	Clear after read off.
ADC_CLEAR_AFTER_READ_ON	Clear after read on.

adc_sample_state_reg_t

enum adc_sample_state_reg_t

ADC sample state registers

Enumerator
ADC_SAMPLE_STATE_REG_CHANNEL_0	Sample state register channel 0.
ADC_SAMPLE_STATE_REG_CHANNEL_1	Sample state register channel 1.
ADC_SAMPLE_STATE_REG_CHANNEL_2	Sample state register channel 2.
ADC_SAMPLE_STATE_REG_CHANNEL_3	Sample state register channel 3.
ADC_SAMPLE_STATE_REG_CHANNEL_4	Sample state register channel 4.
ADC_SAMPLE_STATE_REG_CHANNEL_5	Sample state register channel 5.
ADC_SAMPLE_STATE_REG_CHANNEL_6	Sample state register channel 6.
ADC_SAMPLE_STATE_REG_CHANNEL_7	Sample state register channel 7.
ADC_SAMPLE_STATE_REG_CHANNEL_8	Sample state register channel 8.
ADC_SAMPLE_STATE_REG_CHANNEL_9	Sample state register channel 9.
ADC_SAMPLE_STATE_REG_CHANNEL_10	Sample state register channel 10.
ADC_SAMPLE_STATE_REG_CHANNEL_11	Sample state register channel 11.
ADC_SAMPLE_STATE_REG_CHANNEL_12	Sample state register channel 12.
ADC_SAMPLE_STATE_REG_CHANNEL_13	Sample state register channel 13.
ADC_SAMPLE_STATE_REG_CHANNEL_14	Sample state register channel 14.
ADC_SAMPLE_STATE_REG_CHANNEL_15	Sample state register channel 15.
ADC_SAMPLE_STATE_REG_CHANNEL_16_TO_31	Sample state register channel 16 to 31.

adc_compare_cfg_t

enum adc_compare_cfg_t

ADC comparison settings

adc_window_b_channel_t

enum adc_window_b_channel_t

ADC Window B channel

Enumerator
ADC_WINDOW_B_CHANNEL_0	Window B channel 0.
ADC_WINDOW_B_CHANNEL_1	Window B channel 1.
ADC_WINDOW_B_CHANNEL_2	Window B channel 2.
ADC_WINDOW_B_CHANNEL_3	Window B channel 3.
ADC_WINDOW_B_CHANNEL_4	Window B channel 4.
ADC_WINDOW_B_CHANNEL_5	Window B channel 5.
ADC_WINDOW_B_CHANNEL_6	Window B channel 6.
ADC_WINDOW_B_CHANNEL_7	Window B channel 7.
ADC_WINDOW_B_CHANNEL_8	Window B channel 8.
ADC_WINDOW_B_CHANNEL_9	Window B channel 9.
ADC_WINDOW_B_CHANNEL_10	Window B channel 10.
ADC_WINDOW_B_CHANNEL_11	Window B channel 11.
ADC_WINDOW_B_CHANNEL_12	Window B channel 12.
ADC_WINDOW_B_CHANNEL_13	Window B channel 13.
ADC_WINDOW_B_CHANNEL_14	Window B channel 14.
ADC_WINDOW_B_CHANNEL_15	Window B channel 15.

adc_window_b_mode_t

enum adc_window_b_mode_t

ADC Window B comparison mode

Enumerator
ADC_WINDOW_B_MODE_LESS_THAN_OR_OUTSIDE	Window B comparison condition is less than or outside.

adc_group_a_t

enum adc_group_a_t

ADC action for group A interrupts group B scan. This enumeration is used to specify the priority between Group A and B in group mode.

Enumerator
ADC_GROUP_A_PRIORITY_OFF	Group A ignored and does not interrupt ongoing group B scan.
ADC_GROUP_A_GROUP_B_WAIT_FOR_TRIGGER	Group A interrupts Group B(single scan) which restarts at next Group B trigger.
ADC_GROUP_A_GROUP_B_RESTART_SCAN	Group A interrupts Group B(single scan) which restarts immediately after Group A scan is complete.
ADC_GROUP_A_GROUP_B_RESUME_SCAN	Resume scanning of interrupted channels.
ADC_GROUP_A_GROUP_B_CONTINUOUS_SCAN	Group A interrupts Group B(continuous scan) which continues scanning without a new Group B trigger.

adc_active_trigger_t

enum adc_active_trigger_t

Defines the registers settings for the ADC trigger.

Enumerator
ADC_ACTIVE_TRIGGER_EXTERNAL	Input pin for the trigger.
ADC_ACTIVE_TRIGGER_TRGA1N	Compare match with or input capture to MTU1.TGRA.
ADC_ACTIVE_TRIGGER_TRGA2N	Compare match with or input capture to MTU2.TGRA.
ADC_ACTIVE_TRIGGER_TRGA3N	Compare match with or input capture to MTU3.TGRA.
ADC_ACTIVE_TRIGGER_TRGA0N	Compare match with or input capture to MTU0.TGRA.
ADC_ACTIVE_TRIGGER_TRGA4N	Compare match with or input capture to MTU4.TGRA, or an underflow of MTU4.TCNT (in the trough) in complementary PWM mode.
ADC_ACTIVE_TRIGGER_TRGA6N	Compare match with MTU6.TGRA.
ADC_ACTIVE_TRIGGER_TRGA7N	Compare match with MTU7.TGRA.
ADC_ACTIVE_TRIGGER_TRG0N	Compare match with MTU0.TGRE.
ADC_ACTIVE_TRIGGER_TRG4AN	Compare match between MTU4.TADCORA and MTU4.TCNT.
ADC_ACTIVE_TRIGGER_TRG4BN	Compare match between MTU4.TADCORB and MTU4.TCNT.
ADC_ACTIVE_TRIGGER_TRG4AN_BN	Compare match between MTU4.TADCORA and MTU4.TCNT, or between MTU4.TADCORB and MTU4.TCNT.
ADC_ACTIVE_TRIGGER_TRG4ABN	Compare match between MTU4.TADCORA and MTU4.TCNT, and between MTU4.TADCORB and MTU4.TCNT (when interrupt skipping function 2 is in use)
ADC_ACTIVE_TRIGGER_TRG7AN	Compare match between MTU7.TADCORA and MTU7.TCNT.
ADC_ACTIVE_TRIGGER_TRG7BN	Compare match between MTU7.TADCORB and MTU7.TCNT.
ADC_ACTIVE_TRIGGER_TRG7AN_BN	Compare match between MTU7.TADCORA and MTU7.TCNT, or between MTU7.TADCORB and MTU7.TCNT.
ADC_ACTIVE_TRIGGER_TRG7ABN	(when interrupt skipping function 2 is in use) Compare match between MTU7.TADCORA and MTU7.TCNT, and between MTU7.TADCORB and MTU7.TCNT
ADC_ACTIVE_TRIGGER_ELC_TRIGGER	A/D Startup source A from ELC.
ADC_ACTIVE_TRIGGER_ELC_TRIGGER_GROUP_B	A/D Startup source B from ELC.
ADC_ACTIVE_TRIGGER_DISABLED	A/D Start trigger disabled.

adc_double_trigger_t

enum adc_double_trigger_t

ADC double-trigger mode definitions

Enumerator
ADC_DOUBLE_TRIGGER_DISABLED	Double-triggering disabled.
ADC_DOUBLE_TRIGGER_ENABLED	Double-triggering enabled.
ADC_DOUBLE_TRIGGER_ENABLED_EXTENDED	Double-triggering enabled on both ADC ELC events.

adc_elc_t

enum adc_elc_t

AD event link control definitions.

Enumerator
ADC_ELC_SINGLE_SCAN	At the end of a single scan GCELC = 0b, ELCC[1:0] = 00b.
ADC_ELC_CONTINUOUS_SCAN	At the end of a contiuous scan GCELC = 0b, ELCC[1:0] = 00b.
ADC_ELC_GROUP_A_SCAN	At the end of a group_a scan GCELC = 0b, ELCC[1:0] = 00b.
ADC_ELC_GROUP_B_SCAN	At the end of a group_b scan GCELC = 0b, ELCC[1:0] = 01b.
ADC_ELC_GROUP_A_B_C_SCAN	At the end of a group_abc scan GCELC = 0b, ELCC[1:0] = 1xb.
ADC_ELC_GROUP_C_SCAN	At the end of a group_c scan GCELC = 1b, ELCC[1:0] = 00b.

Function Documentation

R_ADC_Open()

fsp_err_t R_ADC_Open	(	adc_ctrl_t *	p_ctrl,
		adc_cfg_t const *const	p_cfg
	)

Sets the operational mode, trigger sources, interrupt priority, and configurations for the peripheral as a whole. If interrupt is enabled, the function registers a callback function pointer for notifying the user whenever a scan has completed.

Return values

FSP_SUCCESS	Module is ready for use.
FSP_ERR_ASSERTION	An input argument is invalid.
FSP_ERR_ALREADY_OPEN	The instance control structure has already been opened.
FSP_ERR_IRQ_BSP_DISABLED	A callback is provided, but the interrupt is not enabled.
FSP_ERR_IP_CHANNEL_NOT_PRESENT	The requested unit does not exist on this MCU.
FSP_ERR_INVALID_HW_CONDITION	The ADC clock must be at least 1 MHz

R_ADC_ScanCfg()

fsp_err_t R_ADC_ScanCfg	(	adc_ctrl_t *	p_ctrl,
		void const *const	p_channel_cfg
	)

Configures the ADC scan parameters. Channel specific settings are set in this function. Pass a pointer to adc_channel_cfg_t to p_channel_cfg.

Note

This starts group B scans if adc_channel_cfg_t::priority_group_a is set to ADC_GROUP_A_GROUP_B_CONTINUOUS_SCAN.

Return values

FSP_SUCCESS	Channel specific settings applied.
FSP_ERR_ASSERTION	An input argument is invalid.
FSP_ERR_NOT_OPEN	Unit is not open.

R_ADC_InfoGet()

fsp_err_t R_ADC_InfoGet	(	adc_ctrl_t *	p_ctrl,
		adc_info_t *	p_adc_info
	)

Returns the address of the lowest number configured channel and the total number of bytes to be read in order to read the results of the configured channels and return the ELC Event name. If no channels are configured, then a length of 0 is returned.

Note

In group mode, information is returned for group A only. Calculating information for group B is not currently supported.

Return values

FSP_SUCCESS	Information stored in p_adc_info.
FSP_ERR_ASSERTION	An input argument is invalid.
FSP_ERR_NOT_OPEN	Unit is not open.

R_ADC_ScanStart()

fsp_err_t R_ADC_ScanStart

(

adc_ctrl_t *

p_ctrl

)

Starts a software scan or enables the hardware trigger for a scan depending on how the triggers were configured in the R_ADC_Open call. If the unit was configured for ELC or external hardware triggering, then this function allows the trigger signal to get to the ADC unit. The function is not able to control the generation of the trigger itself. If the unit was configured for software triggering, then this function starts the software triggered scan.

Precondition

Call R_ADC_ScanCfg after R_ADC_Open before starting a scan.

Return values

FSP_SUCCESS	Scan started (software trigger) or hardware triggers enabled.
FSP_ERR_ASSERTION	An input argument is invalid.
FSP_ERR_NOT_OPEN	Unit is not open.
FSP_ERR_IN_USE	Another scan is still in progress (software trigger).

R_ADC_ScanGroupStart()

fsp_err_t R_ADC_ScanGroupStart	(	adc_ctrl_t *	p_ctrl,
		adc_group_mask_t	group_mask
	)

adc_api_t::scanGroupStart is not supported on the ADC. Use scanStart instead.

Return values

FSP_ERR_UNSUPPORTED

Function not supported in this implementation.

R_ADC_ScanStop()

fsp_err_t R_ADC_ScanStop

(

adc_ctrl_t *

p_ctrl

)

Stops the software scan or disables the unit from being triggered by the hardware trigger (ELC or external) based on what type of trigger the unit was configured for in the R_ADC_Open function. Stopping a hardware triggered scan via this function does not abort an ongoing scan, but prevents the next scan from occurring. Stopping a software triggered scan aborts an ongoing scan.

Return values

FSP_SUCCESS	Scan stopped (software trigger) or hardware triggers disabled.
FSP_ERR_ASSERTION	An input argument is invalid.
FSP_ERR_NOT_OPEN	Unit is not open.

R_ADC_StatusGet()

fsp_err_t R_ADC_StatusGet	(	adc_ctrl_t *	p_ctrl,
		adc_status_t *	p_status
	)

Provides the status of any scan process that was started, including scans started by ELC or external triggers.

Return values

FSP_SUCCESS	Module status stored in the provided pointer p_status
FSP_ERR_ASSERTION	An input argument is invalid.
FSP_ERR_NOT_OPEN	Unit is not open.

R_ADC_Read()

fsp_err_t R_ADC_Read	(	adc_ctrl_t *	p_ctrl,
		adc_channel_t const	reg_id,
		uint16_t *const	p_data
	)

Reads conversion results from a single channel or sensor.

Return values

FSP_SUCCESS	Data read into provided p_data.
FSP_ERR_ASSERTION	An input argument is invalid.
FSP_ERR_NOT_OPEN	Unit is not open.

R_ADC_Read32()

fsp_err_t R_ADC_Read32	(	adc_ctrl_t *	p_ctrl,
		adc_channel_t const	reg_id,
		uint32_t *const	p_data
	)

Reads conversion results from a single channel or sensor register into a 32-bit result.

Return values

FSP_SUCCESS	Data read into provided p_data.
FSP_ERR_ASSERTION	An input argument is invalid.
FSP_ERR_NOT_OPEN	Unit is not open.

R_ADC_SampleStateCountSet()

fsp_err_t R_ADC_SampleStateCountSet	(	adc_ctrl_t *	p_ctrl,
		adc_sample_state_t *	p_sample
	)

Sets the sample state count for individual channels. This only needs to be set for special use cases. Normally, use the default values out of reset.

Note

The sample states for the temperature and voltage sensor are set in R_ADC_ScanCfg.

Return values

FSP_SUCCESS	Sample state count updated.
FSP_ERR_ASSERTION	An input argument is invalid.
FSP_ERR_NOT_OPEN	Unit is not open.

R_ADC_Close()

fsp_err_t R_ADC_Close

(

adc_ctrl_t *

p_ctrl

)

This function ends any scan in progress, disables interrupts, and removes power to the A/D peripheral.

Return values

FSP_SUCCESS	Module closed.
FSP_ERR_ASSERTION	An input argument is invalid.
FSP_ERR_NOT_OPEN	Unit is not open.

R_ADC_OffsetSet()

fsp_err_t R_ADC_OffsetSet	(	adc_ctrl_t *const	p_ctrl,
		adc_channel_t const	reg_id,
		int32_t	offset
	)

adc_api_t::offsetSet is not supported on the ADC.

Return values

FSP_ERR_UNSUPPORTED

Function not supported in this implementation.

R_ADC_Calibrate()

fsp_err_t R_ADC_Calibrate	(	adc_ctrl_t *const	p_ctrl,
		void const *	p_extend
	)

adc_api_t::R_ADC_Calibrate is not supported on the ADC.

Return values

FSP_ERR_UNSUPPORTED

Function not supported in this implementation.

R_ADC_CallbackSet()

fsp_err_t R_ADC_CallbackSet	(	adc_ctrl_t *const	p_ctrl,
		void(*)(adc_callback_args_t *)	p_callback,
		void const *const	p_context,
		adc_callback_args_t *const	p_callback_memory
	)

Updates the user callback and has option of providing memory for callback structure. Implements adc_api_t::callbackSet

Return values

FSP_SUCCESS	Callback updated successfully.
FSP_ERR_ASSERTION	A required pointer is NULL.
FSP_ERR_NOT_OPEN	The control block has not been opened.